DS DSEN 60444-3 1997-OCT-22 Measurement of quartz crystal unt parameters by zero phase technque n a p-Network - Part 3 Basc method for the measurement of two-termnal parameters of quartz crystal unts up to 200 MHz by phase technque n a p-network wth compensaton of the parallel capactance C0
This report specifies a method for the measurement of the parameters of quartz crystal units using an inductance to compensate for the effects of C0 at the frequency of the crystal unit with accuracy depending on the type of crystals for: a) frequency with a fractional accuracy ranging between 10-6 and 10-8; b) resistance with a fractional accuracy ranging between 2% and 5%; c) motional capacitance and motional inductance with a fractional accuracy ranging between 3% and 7%.
