DS DS/EN 60749-18
DS DSEN 60749-18 2003-MAR-21 Semconductor devces - Mechancal and clmatc test methods - Part 18 onzng radaton total dose
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This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.