DS DS/EN 60749-19/A1
DS DSEN 60749-19A1 2010-SEP-27 Semconductor devces - Mechancal and clmatc test methods - Part 19 De shear strength
DS DSEN 60749-19A1 2010-SEP-27 Semconductor devces - Mechancal and clmatc test methods - Part 19 De shear strength
Determines the integrity of materials and procedures used to attach semiconductor die to package headers or other substrates generally only applicable to cavity packages or as a process monitor.