DS DS/EN 60749-23/A1
DS DSEN 60749-23A1 2011-MAY-02 Semconductor devces - Mechancal and clmatc test methods - Part 23 Hgh temperature operatng lfe
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This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.