DS DS/EN 60749-32/A1
DS DSEN 60749-32A1 2010-SEP-27 Semconductor devces - Mechancal and clmatc test methods - Part 32 Flammablty of plastc-encapsulated devces externally nduced
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Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.