DS DS/EN 61280-2-2
DS DSEN 61280-2-2 2008-SEP-26 Fbre optc communcaton subsystem test procedures - Part 2-2 Dgtal systems - Optcal eye pattern waveform and extncton rato measurement
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The purpose of this part of IEC 61280 is to describe a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.