DS DS/EN 61967-2
DS DSEN 61967-2 2005-NOV-22 ntegrated crcuts - Measurement of electromagnetc emssons 150 kHz to 1 GHz - Part 2 Measurement of radated emssons - TEM cell and wdeband TEM cell method
Cart
(empty)
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a transverse electromagnetic (TEM) or wideband gigahertz TEM (GTEM) cell.