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DS DS/EN 62047-12

DS DSEN 62047-12 2011-DEC-15 Semconductor devces - Mcro-electromechancal devces - Part 12 Bendng fatgue testng method of thn flm materals usng resonant vbraton of MEMS structures

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This part of IEC 62047 specifies a method for bending fatigue testing using resonant vibration of microscale mechanical structures of MEMS (micro-electromechanical systems) and micromachines. This standard applies to vibrating structures ranging in size from 10 ìm to 1 000 ìm in the plane direction and from 1 ìm to 100 ìm in thickness, and test materials measuring under 1 mm in length, under 1 mm in width, and between 0,1 ìm and 10 ìm in thickness. The main structural materials for MEMS, micromachine, etc. have special features, such as typical dimensions of a few microns, material fabrication by deposition, and test piece fabrication by means of non-mechanical machining, including photolithography. The MEMS structures often have higher fundamental resonant frequency and higher strength than macro structures. To evaluate and assure the lifetime of MEMS structures, a fatigue testing method with ultra high cycles (up to 1012) loadings needs to be established. The object of the test method is to evaluate the mechanical fatigue properties of microscale materials in a short time by applying high load and high cyclic frequency bending stress using resonant vibration.

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