DS DS/EN 62416
DS DSEN 62416 2010-JUN-17 Semconductor devces - Hot carrer test on MOS transstors
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IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.